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The Effect of Interface States and Series Resistance on Current-Voltage Characteristics in (MIS) Schottky Diodes
Zeyrek, Sedat (Afyon Kocatepe Üniversitesi, 2015)The current-voltage (I-V) characteristics of metal-insulator-semiconductor (MIS) Al/Si3N4/p-Si Schottky barrier diodes (SBDs) were measured at room temperature. Al/Si3N4/p-Si structure has been fabricated by the ...